InSEM® HT Nanoindenter

InSEM® HT Nanoindenter

The InSEM® HT (high temperature) nanoindentation system measures hardness, modulus and stiffness at high temperature by independently heating both the tip and sample in a vacuum environment. The InSEM HT is compatible with scanning electron microscope (SEM) and focused ion beam (FIB) chambers, or standalone vacuum chambers. The accompanying InView software helps advanced researchers develop novel experiments. Scientific publications show that InSEM HT results match well to traditional large-scale high temperature nanoindentation test data. The combination of wide temperature range capability and low cost of ownership makes the InSEM HT nanoindentation system a valuable tool in materials development research programs.

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