Product Description
The Candela 7100 series advanced defect detection and classification system is designed specifically for hard disk drive substrates and media. A high-powered dual-wavelength laser is optimized for current defect of interest (DOI) challenges, and multi-channel scatter detectors provide enhanced sensitivity for classification of sub-micron pits, bumps, particles, and buried defects on a full range of substrates. The capability and stability of the 7100 series defect inspector ensures that one platform can be used for multiple process control application points, reducing dependency on tools and methods such as atomic force, scanning electron, and transmission electron microscopes to investigate defects and identify root cause.
Features
- Detects and classifies HDD sub-micron pits, bumps, particles, buried defects on metal and glass, substrates and media with full disk defect maps
- Provides faster time to results through full disk maps, with classified defects and actionable data output
- Reduces dependence on off-line inspection technologies (AFM, SEM, TEM, etc.) resulting in reduced overall cost of ownership
- Available in either a manual (7110) or fully-automated (7140) configuration
Use Cases
- Defect inspection
- Scratch and ridge inspection
- Particle and stain inspection
- Laser texture analysis
- Carbon uniformity analysis and carbon void inspection
- Recording layer and soft underlayer mapping
- Lube uniformity analysis
- Magnetic imaging
Options
- Precision diamond scribe
- High Sensitivity (HS) option
- Magnetic imaging
- Offline software large form factor software license
