Certified & Remanufactured

Defect Inspection

Surfscan® Series

Unpatterned Wafer Defect Inspection Systems

The Surfscan® unpatterned wafer inspection systems identify defects and surface quality issues that affect the performance and reliability of semiconductor devices. It supports IC, OEM, materials and substrate manufacturing by qualifying and monitoring tools, processes and materials, by quickly isolating surface defects.

Applications

Process qualification, Tool qualification, Tool monitoring, Outgoing wafer quality control, Incoming wafer quality control, Resist and scanner qualification, Process debug.

Related Products

Surfscan SP2XP:

Unpatterned wafer inspection system targeted for technologies ≥ 45nm design node.

Download brochure.

Surfscan SP2:

Unpatterned wafer inspection system targeted for technologies ≥ 65nm design node.

Download brochure.

Surfscan SP1DLS Pro:

Unpatterned wafer inspection system targeted for technologies ≥ 90nm design node.

Download brochure.

Surfscan SP1TBI Pro:

Unpatterned wafer inspection system targeted for technologies ≥ 130nm design node.

Download brochure.

2835, 2367

Broadband Plasma Patterned Wafer Defect Inspection Systems

The 2835 and 2367 broadband plasma defect inspection systems provide industry proven performance for optical patterned defect inspection, enabling discovery and monitoring of yield-critical defects on ≥ 45nm logic, memory and specialty devices. Each model is uniquely equipped with selectable wavelength illumination, imaging pixels, optic modes and advanced algorithms for noise suppression and defect separation to provide cost-effective, inline inspection control for your most critical levels.

Applications

Inline defect discovery and monitoring, Hotspot discovery, Engineering analysis, Process window qual, Photo cell monitoring.

Related Products

2835:

Patterned wafer inspection system with broadband DUV-UV-Visible spectrum targeted for ≥45nm design nodes.

Download brochure.

2367:

Patterned wafer inspection system with broadband UV-Visible spectrum targeted for ≥65nm design nodes.

Download brochure.

Certified & Remanufactured

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